Morphable Reflectance Fields for Enhancing Face Recognition

In this paper, we present a novel framework to address the confounding effects of illumination variation in face recognition. By augmenting the gallery set with realistically relit images, we enhance recognition performance in a classifier-independent way. We describe a novel method for single-image relighting. Morphable Reflectance Fields (MoRF), which does not require manual intervention and provides relighting superior to that of existing automatic methods. We test our framework through face recognition experiments using various state-of-the-art classifiers and popular benchmark datasets: CMU PIE, Multi-PIE, and MERL Dome. We demonstrate that our MoRF relighting and gallery augmentation framework achieves improvements in terms of both rank-1 recognition rates and ROC curves. We also compare our model with other automatic relighting methods to confirm its advantage. Finally, we show that the recognition rates achieved using our framework exceed those of state-of-the-art recognizers on the aforementioned databases.


  • Related News & Events

    •  NEWS   CVPR 2010: 8 publications by C. Oncel Tuzel, Tim K. Marks, Yuichi Taguchi, Srikumar Ramalingam, Michael J. Jones and Amit K. Agrawal
      Date: June 13, 2010
      Where: IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
      MERL Contacts: Michael Jones; Tim Marks
      • The papers "Optimal Coded Sampling for Temporal Super-Resolution" by Agrawal, A.K., Gupta, M., Veeraraghavan, A.N. and Narasimhan, S.G., "Breaking the Interactive Bottleneck in Multi-class Classification with Active Selection and Binary Feedback" by Joshi, A.J., Porikli, F.M. and Papanikolopoulos, N., "Axial Light Field for Curved Mirrors: Reflect Your Perspective, Widen Your View" by Taguchi, Y., Agrawal, A.K., Ramalingam, S. and Veeraraghavan, A.N., "Morphable Reflectance Fields for Enhancing Face Recognition" by Kumar, R., Jones, M.J. and Marks, T.K., "Increasing Depth Resolution of Electron Microscopy of Neural Circuits using Sparse Tomographic Reconstruction" by Veeraraghavan, A., Genkin, A.V., Vitaladevuni, S., Scheffer, L., Xu, S., Hess, H., Fetter, R., Cantoni, M., Knott, G. and Chklovskii, D., "Specular Surface Reconstruction from Sparse Reflection Correspondences" by Sankaranarayanan, A., Veeraraghavan, A.N., Tuzel, C.O. and Agrawal, A.K., "Fast Directional Chamfer Matching" by Liu, M.-Y., Tuzel, C.O., Veeraraghavan, A.N. and Chellappa, R. and "Robust RVM regression using sparse outlier model" by Mitra, K., Veeraraghavan, A. and Chellappa, R. were presented at the IEEE Conference on Computer Vision and Pattern Recognition (CVPR).