TR2018-193

Trip Report on IEDM 2018

    •  Teo, K.H., "Trip Report on IEDM 2018," Tech. Rep. TR2018-193, Mitsubishi Electric Research Laboratories, March 2019.
      BibTeX TR2018-193 PDF
      • @techreport{Teo2019mar1,
      • author = {Teo, Koon Hoo},
      • title = {Trip Report on IEDM 2018},
      • institution = {Mitsubishi Electric Research Laboratories},
      • year = 2019,
      • month = mar,
      • url = {https://www.merl.com/publications/TR2018-193}
      • }
  • MERL Contact:
  • Research Areas:

    Applied Physics, Electronic and Photonic Devices

Abstract:

Koon Hoo Teo attended the International Electron Device Meeting (IEDM) 2018 in San Francisco from Dec 1 to 5, 2018. The meeting has attracted many attendees, more than 3,000, as this is considered as the gold standard for semiconductor devices research. As expected, this meeting is well attended by both academia and Industries. Areas of interest include Quantum Computing (6 papers), Negative Capacitance and Ferroelectric (17 papers) and GaN (9 Papers) and many others.